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Speedy observation and analysis with no specimen treatment using
the benchtop SEM JCM-7000 !
-Introduction to the effective use of LowVacuum(LV) mode-
Why don't you try an SEM observation of insulating specimens that do not conduct electricity as they are, without any pre-treatment?

We will introduce examples of effective use of the JCM-7000 in a low vacuum (LV) mode for polymeric materials, industrial materials, minerals, foods, and living organisms/plants.

The JCM-7000 is a benchtop Scanning Electron Microscope based on a key concept of "Easy-to-use SEM/EDS just for anyone".

When you place the JCM-7000 next to an optical microscope, further-faster and more-detailed foreign material analysis and quality control can be made.

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JEOL Ltd.