Why don't you try an SEM observation of insulating specimens that do not conduct electricity as they are, without any pre-treatment?
We will introduce examples of effective use of the JCM-7000 in a low vacuum (LV) mode for polymeric materials, industrial materials, minerals, foods, and living organisms/plants.
The JCM-7000 is a benchtop Scanning Electron Microscope based on a key concept of "Easy-to-use SEM/EDS just for anyone".
When you place the JCM-7000 next to an optical microscope, further-faster and more-detailed foreign material analysis and quality control can be made.